The Open Microscopy Environment OMERO.server version 5.4.0 to 5.4.6 contains a Information Exposure Through Sent Data vulnerability in OMERO.server that can result in an Attacker gaining full administrative access to server and may be able to disable it. This vulnerability appears to have been fixed in 5.4.7.
This vulnerability carries a MEDIUM severity rating with a CVSS v3.1 score of 6.7, requiring local system access to exploit with relatively low complexity without requiring user interaction . The vulnerability impacts confidentiality (data exposure), integrity (unauthorized modifications), and availability (service disruption) for affected systems. Impacting 1 product from openmicroscopy organizations running these solutions should prioritize assessment and patching.
First disclosed in 2018, this vulnerability was reported during a period defined by widespread IoT adoption challenges, mobile security concerns, and the emergence of advanced persistent threat (APT) techniques. Contemporary mitigation strategies focused on secure development practices and third-party component vetting.
2018-08-20T19:31:33.247
2024-11-21T03:40:17.447
Modified
CVSSv3.0: 6.7 (MEDIUM)
AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
| Type | Vendor | Product | Version/Range | Vulnerable? |
|---|---|---|---|---|
| Application | openmicroscopy | omero | ≤ 5.4.6 | Yes |
SecUtils normalizes and enriches National Vulnerability Database (NVD) records by standardizing vendor and product identifiers, aggregating vulnerability metadata from both NVD and MITRE sources, and providing structured context for security teams. For openmicroscopy's affected products, we extract Common Platform Enumeration (CPE) data, Common Weakness Enumeration (CWE) classifications, CVSS severity metrics, and reference data to enable rapid vulnerability prioritization and asset correlation. This record contains no exploit code, proof-of-concept instructions, or attack methodologies—only defensive intelligence necessary for patch management, risk assessment, and security operations.